![Kontaktne sonde]({"xsmall":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.100.33.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","small":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.360.120.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","medium":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.768.256.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","large":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1024.341.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","xlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","xxlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","max":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg"} "Kontaktne sonde")
Kontaktne sonde
Za visoku tačnost i različite zadatke merenja
Glave kontaktnih sondi na KMM
Kontaktne sonde predstavljaju idealno rešenje kada se zahteva izuzetno visok nivo tačnosti. U kontaktnoj mernoj tehnologiji površina radnog komada se meri tačku po tačku ili se, u zavisnosti od sonde, skenira velikim brzinama. ZEISS nudi širok izbor kontaktnih sondi kako bi obezbedio pravo rešenje za vašu aplikaciju.
Merenje pojedinačnih tačaka u poređenju sa ZEISS tehnologijom skeniranja
U poređenju sa merenjem pojedinačnih tačaka, skeniranje omogućava brža i preciznija merenja, jer meri više tačaka za kraće vreme.
Merenje pojedinačnih tačaka
Kod merenja sondama za pojedinačne tačke meri se isključivo svaka tačka zasebno. Zatim je potrebno pomeriti merni vrh i ponoviti proces. Stanja između mernih tačaka se izračunavaju interpolacijom, što može dovesti do odstupanja u merenju. Merenje sondama za pojedinačne tačke je pogodno za male obime merenja i velike tolerancije. Moguća je kombinacija sa ZEISS RDS sistemom.
Tehnologija skeniranja
Tokom skeniranja, merna glava se kreće ravnomerno i konstantno, akvizirajući stotine mernih tačaka u kratkom vremenskom periodu dok merni vrh prati konturu površine. Ovaj proces ne samo da obezbeđuje znatno više podataka uz veći protok, već omogućava i velike uštede vremena.
Skenirajuće sonde se pogodne za visok protok delova uz izuzetnu tačnost.
![Merenje pojedinačnih tačaka]({"xsmall":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.100.75.14,0,946,699.file/touch-trigger.jpg","small":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.360.270.14,0,946,699.file/touch-trigger.jpg","medium":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.768.576.14,0,946,699.file/touch-trigger.jpg","large":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","xlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","xxlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","max":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg"} "Merenje pojedinačnih tačaka")
![Tehnologija skeniranja]({"xsmall":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.100.75.14,0,946,699.file/scanning.jpg","small":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.360.270.14,0,946,699.file/scanning.jpg","medium":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.768.576.14,0,946,699.file/scanning.jpg","large":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","xlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","xxlarge":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","max":"https://www.zeiss.rs/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg"} "Tehnologija skeniranja")
Prednosti integrisanog toka skeniranja
Za razliku od tačkastog merenja gde se odnosi između pojedinačnih tačaka utvrđuju interpolacijom, tehnologija skeniranja omogućava prikupljanje značajno veće količine podataka i postizanje veće pouzdanosti i preciznosti merenja. Zahvaljujući visokoj brzini skeniranja, postiže se veći merni protok i efikasnija kontrola većeg broja delova u pogledu odstupanja. Brže skeniranje takođe smanjuje potrebu za brojem koordinatna merna mašina, a brže otkrivanje problema doprinosi redukciji otpada i potrebe za dodatnom obradom radnih komada.